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How to fill out the Ion Probe Application Form online
Filling out the Ion Probe Application Form online requires careful attention to detail in order to ensure that all necessary information is submitted accurately. This guide will walk you through each section of the form, providing you with the insights needed to complete it successfully.
Follow the steps to complete the Ion Probe Application Form accurately.
- Click the ‘Get Form’ button to access the Ion Probe Application Form and open it in your preferred editing tool.
- In the first section, provide the name, lab, email, and phone number of the person responsible for the project. Ensure that all contact details are accurate for timely communication.
- Next, enter the title of your project. Make sure it reflects the main focus of your research clearly and concisely.
- Fill in the names, emails, and phone numbers (if available) of any researchers or students who will be directly involved in the measurements. List these individuals to ensure they are recognized within the project framework.
- Provide a detailed description of the samples and minerals to be analyzed. Include specifics such as size, zoning, and whether they are fractured, mounted in epoxy, or thin section.
- Summarize your project in a concise paragraph, outlining the main goals and significance of your research.
- In the analyses section, specify whether you will be conducting elemental or isotopic analyses. List the elements or isotope ratios that you intend to measure.
- Detail the expected spatial and analytical precisions for your measurements, ensuring clarity on the precision levels required.
- Indicate the number of analyses you plan to conduct as part of your project.
- Inquire about the availability of standards that encompass the major element compositional range of your samples, and describe them if applicable.
- List any relevant publications related to your project, particularly those that contain information about the methods and standards used to ensure successful completion of your project.
- Once all sections are completed, review your form for accuracy before choosing to save changes, download, print, or share the form.
Complete and submit the Ion Probe Application Form online to facilitate your project.
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a technique in which an ion beam (primary ion) is irradiated on a solid sample and mass separation of the ions emitted from the surface (secondary ions) is performed using the difference in time-of-flight (time-of-flight is proportional to the square root of ...
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