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On fault-tuple equivalence trees to further improve diagnosis quality. Abstract Approved: Thesis Supervisor Title and Department Date DIAGNOSIS OF VLSI CIRCUIT DEFECTS: DEFECTS IN SCAN CHAIN AND CIRCUIT LOGIC by Xun Tang A thesis submitted in partial fulfillment of the requirements for the Doctor of Philosophy degree in Electrical and Computer Engineering in the Graduate College of The University of Iowa December 2010.

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There are so many possible defects to choose from. Memory Fault Model. Stuck-at Faults. Bridging Faults. Delay Faults. Stuck-Open Fault Model. Stuck-Short Fault Model.

First, a flush test is conducted to find the defective scan chain. Next, a fault is injected in each scan cell, and a fault simulation is executed for each cell to collect its simulated fault response in a software-based simulation environment.

The Defect is the difference between the actual outcomes and expected outputs. An Error is a mistake made in the code; that's why we cannot execute or compile code. The Fault is a state that causes the software to fail to accomplish its essential function.

Fault Models The text describes each of the following fault types: Assertion Fault. Behavioral Fault. Branch Fault. Bridging (*) Bus Fault. Cross-point Fault. Defect-oriented Fault (physical level faults, bridging, stuck-open, IDDQ).

Defect: A defect in an electronic system is the unintended difference between the implemented hardware and its intended design. Defects can be Process Defects, Material Defects, Age Defects, and Package Defects. Fault: A representation of a “defect” at the abstracted function level is called a fault.

Given a logic circuit that fails a test, diagnosis is the process of narrowing down the possible locations of the defects.

Fault: A manifestation of na 'Error' in software. Faults are also known colloquially as defaults or bugs. Defect: The departure of a quality characteristic from its specified value that results in a product not satisfying its normal usage requirements.

Common Fault Models Single stuck-at faults • Transistor open and short faults • Memory faults • PLA faults (stuck-at, cross-point, bridging) • Functional faults (processors) • Delay faults (transition, path) • Analog faults • For more examples, see Section 4.4 (p.

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Adoption
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Contractors
Divorce
Home Sales
Employment
Identity Theft
Incorporation
Landlord Tenant
Living Trust
Name Change
Personal Planning
Small Business
Wills & Estates
Packages A-Z
Form Categories
Affidavits
Bankruptcy
Bill of Sale
Corporate - LLC
Divorce
Employment
Identity Theft
Internet Technology
Landlord Tenant
Living Wills
Name Change
Power of Attorney
Real Estate
Small Estates
Wills
All Forms
Forms A-Z
Form Library
Customer Service
Terms of Service
DMCA Policy
About Us
Blog
Affiliates
Contact Us
Privacy Notice
Delete My Account
Site Map
All Forms
Search all Forms
Industries
Forms in Spanish
Localized Forms
Legal Guides
Real Estate Handbook
All Guides
Prepared for You
Notarize
Incorporation services
Our Customers
For Consumers
For Small Business
For Attorneys
Our Sites
US Legal Forms
USLegal
FormsPass
pdfFiller
signNow
airSlate workflows
DocHub
Instapage
Social Media
Call us now toll free:
1-877-389-0141
As seen in:
  • USA Today logo picture
  • CBC News logo picture
  • LA Times logo picture
  • The Washington Post logo picture
  • AP logo picture
  • Forbes logo picture
© Copyright 1997-2025
airSlate Legal Forms, Inc.
3720 Flowood Dr, Flowood, Mississippi 39232